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SFT-9500 High Performance XRF Coating Thickness Gauge

Advanced x-ray microfocus technology has achieved a high brilliance beam with an actual beam size of less than 0.1 mm in diameter. The SFT-9500 is capable of measurements of micro spots and thin film applications such as lead frames, connectors, and flexible PCBs that are difficult to measure with conventional models due to insufficient xrf intensity from measurement samples. Also suitable for RoHS & ELV analysis.
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Features:

Ultra Thin Film and Multilayered Film Measurement

Poly capillary X-ray focusing optics system enables micro beam size of less than 0.1 mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, SFT 9500 series has a capability of quantitative measurement of single nanometer of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layers in multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.

Hazardous Substance Analysis (for RoHS and ELV compliance)

SFT9 500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector (liquid nitrogen free) is able to detect microelements. Examples are Pb in Pb-free solder and electoless nickel that are typical components in electric, electronics, and automotive products.

Particle Analysis

High intensity micro beam combined with high count rate detector makes possible particle analysis. CCD camera can specify particles, and then subtraction spectrum display functions allow the qualitative analysis of the particles (Al to U).

Data Processing

Microsoft® EXCEL is equipped with statistical processing function that compiles measurement data as STDEV, Mean, Max, Min, CV, and Cpk. Microsoft® WORD provides detailed measurement reports with the sample image

Mapping

Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.

  • Elements     Atomic No. 13 (Al) to 83 (Bi)
  • X-ray source     Air-cooled X-ray Tube (Mo target), Voltage: 50 kV , Current: 1 mA
  • Detector     Semiconductor Detector (No LN2 required)
  • X-Ray Focusing Optics System     Capillary
  • Sample Observation     CCD camera with zoom
  • Sample image focus     Laser Pointer
  • Filter     Primary filter: 3 positions automatic switching, Secondary filter: Co, automatic switching
  • Sample Stage  (Stage size ) (Traveling )    640 (W) x 810 (D) x 900 (H) mm , X: 220 mm, Y: 150 mm, Z: 150 mm 930 (W) x 860 (D) x 900 (H) mm , X: 400 mm, Y: 300 mm, Z: 50 mm
  • Controller     Desktop Computer with 19 inch LCD monitor
  • Application Software     Thin Film FP (All types of thin films: Max 5 layers, 10 elements per layer), Calibration, Bulk FP method (material composition analysis)
  • Data Process     Microsoft® Excel, Microsoft® Word
  • Safety Function     Sample door interlock, Sample crash prevention mechanism

• Coating solution analysis (Bulk Calibration)
• Spectrum matching software (Material ID)
• Mapping (Intensity surface analysis multi point display) software
• Filter for ultrathin Au film


*Microsoft is a registered trademark of Microsoft Corporation in the United States and other countries.

Reviews From Other Clients

Local QSHE Manager

“To Alternate Systems,

I wanted to take this opportunity to commend you for your contribution to our facility’s efforts – in our 2014 corporate review, our facility was given exemplary marks for our processes regarding the control and maintenance of monitoring and recording devices within the warehouse; our high performance in these areas is made possible by your company’s diligent work in keeping our equipment calibrated and in excellent condition. I can personally attest to the knowledge, patience, and work ethic your company brings to bear in tending to our needs and helping us ensure that we are able to surmount any issues that could affect our business. See below for an excerpt from our most recent audit listing the “Best in Class” designations we received in the areas of measuring equipment control and maintenance:

IMTE – Control of Monitoring and Measuring Devices: Very thorough control of the temperature and scale equipment tracking, calibration and maintenance. Very critical in a GXP site.

Temperature Control and Monitoring: Very robust / compliant system in place for Temperature Mapping, Control, Maintenance and oversight.

Warmest Regards,

Alex Gaskin
Local QSHE Manager”

Cimcon Finishing

“To whom it may concern,

This is to confirm Cimcon finishing has had business relationship with Alternate systems for over ten years. The quality of service provided by Mr. Peter Wright has been unsurpassed among our other suppliers and service providers. Technical knowledge, Prompt response, sense of partnership with its customers and working with their team on regular base to advance their knowledge of the products and services available is among few of many offered by Alternate systems.

As such I always highly recommend Mr. Wright to other friends and colleagues in our industry. Please feel free to contact me if you need to discuss in further detail.

Sincerely,

Tony Pajoohi
Plant Manager
Cimcon Finishing”

Intech NDE

“Hi Peter,

Thanks for following up. I would like to let you know that you knocked it out of the park. Everything was as you said it would be and you delivered well within my requirements for time. We will be forwarding all of our feritscope units to your facility for recertification from here on. Thanks for your help.

Yours truly,

Stan Swartz
CET, Electronics Service Center Manager
Intech NDE”

Hocker Inc. Sales and Service

“We always receive prompt service from Alternate Systems and their documentation is outstanding.

Lewis Briltain
Hocker Inc. Sales and Service