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Hitachi EA6000VX High Sensitivity XRF Analyzer

High Sensitivity XRF Analyzer perfect for RoHS & ELV Analysis

The EA6000VX enables control of hazardous substances over entire surfaces and measurement of microscopic points at a specified area. These tasks cannot be done by conventional instruments.

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Features:

High Speed Mapping

High count rate detector of 150,000 cps at maximum and large stage that scans 250mm x 200mm area at maximum enables high speed mapping. In 100mm x 100mm area mapping, EA6000VX detects and locates lead contained in terminal of mounting board in a few minutes.For example, possibilities include composition measurement of hazardous substances in Pb-free solder plating, Sn plating of lead frames, and electroless Ni plating.

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LN2 Less High Count Rate Detector

Equipped with the world’s best class high count rate detector (15 times improved count rate compared with conventional model), EA6000VX improves measurement efficiency.

Additionally, the detector does not require LN2, improving safety and work efficiency of an operator.

Continuous multi-point measurements

Up to 500 points can be set and continuously measured as with an auto-sampler. Measuring large samples exhibits tremendous throughput.

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Contaminant Analysis

With \its high speed mapping function, EA6000VX is able to detect and locate small metal contaminant sized around tens of micro meters in wide measurement area (at maximum of 250mm x 200mm). Small or minute amount of contaminant contained in organic substances including resin, can be also detected.

Technologically Enhanced Operability -Auto Approach and Sample Collision Prevention Mechanism-

Auto Approach Function measures the sample height and automatically adjusts the distance between sample and detector so that operator can easily measure samples with complicated shapes. In the case of manual operation, Sample Collision Prevention Mechanism prevents sample damages.

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Light Element Measurement

With He purge option, EA6000VX is able to measure light elements starting from Na. Its stable and unique system that purges He only during measurement lowers the running cost.

See-through Mapping Fuction

Beginning with Pb on internal boards, various mapping images of elements can be obtained without taking apart products with unknown internal structures, such as laptop computers and cell phones. By comparing mapping images of elements obtained by penetrating X-rays, various information can be obtained about the structure and internal components.

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RoHS Inspection

Enables effective and highly sensitive analysis of RoHS restricted substances contained in resin and metals. Specific point measurement for complex material is possible.

Microscopic area coating thickness measurements

The EA6000VX is capable of coating thickness measurements typical of the SFT series including coating thickness measurement of ultra-thin Au films. Analysis of hazardous substances such as Pb in plating can be measured simultaneously with coating thickness measurements.

High Precision Overlap Function

By high precision analysis over a wide area enabled by the complete overlap of sample image and mapping image by employing a telecentric optic system and high precision XY stage, areas that contain target elements are easily specified. Whole area of 250mm x 200mm is shown in top view, and position precision of zoom in from wide view is within 100um.

  • Elements     Atomic nos. 12 (Mg) to 92 (U) , *Atomic nos. when using helium purge 11 (Na) to 92 (U)
  • Sample State     Solid / Powder / Liquid
  • X-ray source     Air-cooled X-ray tube (W target) , Voltage: 15kV, 30kV, 40kV, 50kV , Current: 20 to 1000uA
  • X-ray direction     Top-down Irradiation
  • Detector     Vortex Si semiconductor detector (No liquid nitrogen required)
  • Analysis area (beam size)     Square 0.2mm, 0.5mm, 1.2mm, 3mm, Electric switching, Electric switching
  • Sample Observation     High resolution CCD camera, 2 system
  • Chamber     580 (W) x 450 (D) X 150 (H) mm, Both point analysis and mapping for entire 250 (X) X 200 (Y) mm
  • Filter     6 mode automatic switching
  • Controller     Desktop PC and 19″ LCD monitor
  • Mapping functions     Align with sample image, Area integrated spectral display, Quantitative integrated function
  • Qualitative functions     Spectrum measurement, Auto-ID, Comparison display
  • Quantitative functions     Bulk CAL, Bulk FP, Film CAL, Film FP
  • Data Process     Microsoft® Excel, Microsoft® Word
  • Power requirements (Electric box included)     AC100V to 240V ±10%, 750VA max.

• Helium Purge
• Joystick Controller
• Signal Tower
• Dual Monitor
• Sample Holder
• Sample Setting Film
• Printer
• HSEASY (Precision control software)


*Microsoft is a registered trademark of Microsoft Corporation in the United States and other countries.

Reviews From Other Clients

Local QSHE Manager

“To Alternate Systems,

I wanted to take this opportunity to commend you for your contribution to our facility’s efforts – in our 2014 corporate review, our facility was given exemplary marks for our processes regarding the control and maintenance of monitoring and recording devices within the warehouse; our high performance in these areas is made possible by your company’s diligent work in keeping our equipment calibrated and in excellent condition. I can personally attest to the knowledge, patience, and work ethic your company brings to bear in tending to our needs and helping us ensure that we are able to surmount any issues that could affect our business. See below for an excerpt from our most recent audit listing the “Best in Class” designations we received in the areas of measuring equipment control and maintenance:

IMTE – Control of Monitoring and Measuring Devices: Very thorough control of the temperature and scale equipment tracking, calibration and maintenance. Very critical in a GXP site.

Temperature Control and Monitoring: Very robust / compliant system in place for Temperature Mapping, Control, Maintenance and oversight.

Warmest Regards,

Alex Gaskin
Local QSHE Manager”

Cimcon Finishing

“To whom it may concern,

This is to confirm Cimcon finishing has had business relationship with Alternate systems for over ten years. The quality of service provided by Mr. Peter Wright has been unsurpassed among our other suppliers and service providers. Technical knowledge, Prompt response, sense of partnership with its customers and working with their team on regular base to advance their knowledge of the products and services available is among few of many offered by Alternate systems.

As such I always highly recommend Mr. Wright to other friends and colleagues in our industry. Please feel free to contact me if you need to discuss in further detail.

Sincerely,

Tony Pajoohi
Plant Manager
Cimcon Finishing”

Intech NDE

“Hi Peter,

Thanks for following up. I would like to let you know that you knocked it out of the park. Everything was as you said it would be and you delivered well within my requirements for time. We will be forwarding all of our feritscope units to your facility for recertification from here on. Thanks for your help.

Yours truly,

Stan Swartz
CET, Electronics Service Center Manager
Intech NDE”

Hocker Inc. Sales and Service

“We always receive prompt service from Alternate Systems and their documentation is outstanding.

Lewis Briltain
Hocker Inc. Sales and Service