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High Performance Fluorescent X-ray (XRF) Coating

The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex™ silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Features:

High precision measurement at micro spots

The FT150, having a irradiation spot size of 30µm (FWHM:17µm), achieved a fluorescent X-ray intensity twice that of the conventional instrument, FT9500X. For typical application, measurement time to obtain same precision is reduced by half.

Product lineup for various applications

  • For measuring an ultra thin film and micro spots of electronic components.
  • For measuring a large printed circuit boards of 600mm x 600mm.
  • For simultaneous measurement Sn/Ni coating.

Safe and easy to use

The newly designed door with a wide opening width let you set the sample very easily. The closed housing minimizes the risk of X-ray leakage.

Enhanced visibility of measurement spots

A large observation window and optimized parts arrangement improved visibility of the measurement position while the chamber door is closed.

Clear sample image

The higher-resolution sample observation camera with a fully digital zoom provides the clear image of the sample having several tens of micrometers in diameter at a desired observation position. Lighting unit for sample observation adopting LED does not require lamp replacement.

New graphical user interfaces

  • User setting of measurement methods and samples can be registered as an application icon. Any image such as a sample picture and an illustration of the multilayer can be used for icon image. Measurement recipie can be selected quickly and easily.
  • Measurement Navi Window guides user through operation procedures.
  • Elements     Atomic No. 13(Al) to 92(U)
  • X-ray source     Tube voltage: 45kV
  • Detector     SDD detector (No LN2 required)
  • X-Ray Focusing Optics System     Polycapillary
  • Sample Observation     CCD camera(1 million pixels)
  • Sample image focus     Laser focus, auto focus
  • Sample Stage  (Stage size ) (Traveling )    400(W)×300(D)×100(H) mm ,400(W)×300(D)×100(H) mm, 600(W)×600(D)×20(H) mm
  • Stage travel    400(W)×300(D)mm, 400(W)×300(D)mm, 300(W)×300(D)mm
  • Controller     Personal computer with 22 inch LCD Monitor
  • Measurement software    Thin film FP (Max 5 layers, 10 elements) , Thin film Calibration curve method, Qualitative analysis
  • Data Process     Microsoft Excel, Microsoft Word
  • Safety Function     Interlocked chamber door
  • Power consumption     Less than 300VA
  • Spectrum matching software (Material ID)
  • Bulk FP (Metallick component ratio)
  • Stage Operation Restriction
  • Wafer holder (FT150 / FT150h)
  • Touch panel monitor
  • Signal tower
  • Printer

*Microsoft is a registered trademark of Microsoft Corporation in the United States and other countries.

Reviews From Other Clients

Local QSHE Manager

“To Alternate Systems,

I wanted to take this opportunity to commend you for your contribution to our facility’s efforts – in our 2014 corporate review, our facility was given exemplary marks for our processes regarding the control and maintenance of monitoring and recording devices within the warehouse; our high performance in these areas is made possible by your company’s diligent work in keeping our equipment calibrated and in excellent condition. I can personally attest to the knowledge, patience, and work ethic your company brings to bear in tending to our needs and helping us ensure that we are able to surmount any issues that could affect our business. See below for an excerpt from our most recent audit listing the “Best in Class” designations we received in the areas of measuring equipment control and maintenance:

IMTE – Control of Monitoring and Measuring Devices: Very thorough control of the temperature and scale equipment tracking, calibration and maintenance. Very critical in a GXP site.

Temperature Control and Monitoring: Very robust / compliant system in place for Temperature Mapping, Control, Maintenance and oversight.

Warmest Regards,

Alex Gaskin
Local QSHE Manager”

Cimcon Finishing

“To whom it may concern,

This is to confirm Cimcon finishing has had business relationship with Alternate systems for over ten years. The quality of service provided by Mr. Peter Wright has been unsurpassed among our other suppliers and service providers. Technical knowledge, Prompt response, sense of partnership with its customers and working with their team on regular base to advance their knowledge of the products and services available is among few of many offered by Alternate systems.

As such I always highly recommend Mr. Wright to other friends and colleagues in our industry. Please feel free to contact me if you need to discuss in further detail.

Sincerely,

Tony Pajoohi
Plant Manager
Cimcon Finishing”

Intech NDE

Safe and easy to use

The newly designed door with a wide opening width let you set the sample very easily. The closed housing minimizes the risk of X-ray leakage.

“Hi Peter,

Thanks for following up. I would like to let you know that you knocked it out of the park. Everything was as you said it would be and you delivered well within my requirements for time. We will be forwarding all of our feritscope units to your facility for recertification from here on. Thanks for your help.

Yours truly,

Stan Swartz
CET, Electronics Service Center Manager
Intech NDE”

Hocker Inc. Sales and Service

“We always receive prompt service from Alternate Systems and their documentation is outstanding.

Lewis Briltain
Hocker Inc. Sales and Service