For over 30 years Alternate Systems has been specializing in XRF to test coating and plating applications to determine composition and thickness and calibrate XRF Standards. With this non-destructive and robust technology, we are capable of analyzing an assortment of layers and elements with highly effective results on very small areas. Applications include measuring layers of plated precious metals applied in electronics and semiconductor manufacturing, and detection and quantification of the RoHS hazardous materials,
Alternate Systems continues to develop novel applications for measurement. Alternate Systems provides measurement reports that quickly and simply convey otherwise complex parameters. Our X-ray Fluorescence (XRF) services are NIST traceable in accordance with ANSI/NCSL Z540.3, ISO 9001:2008 and ISO/IEC 17025:2005.
If you have questions about what X-Ray Fluorescence (XRF) can do for you and your team, contact Alternate Systems today!