Alternate Systems provides a wide range of calibration services including electronics test and measurement, temperature, non-destructive test, coating thickness measurement, force, and weight. Alternate Systems is an authorized distributor for Hitachi High Technologies X-ray fluorescence (XRF) coating thickness measurement and material analysis instrumentation, and provides radiation safety systems and training.
Alternate Systems was founded in 1986 as a manufacturers’ representative for non-destructive coating and plating analyzers. In 1988, we began manufacturing metal foil and plated standards for use with X-ray fluorescence (XRF) coating analyzers and offering calibration services for XRF coating analyzers and other non-destructive coating thickness measuring instruments and standards.
As our clients’ demand for our calibration services expanded, we expanded to include other measuring instruments and process controls. In 1994 Alternate Systems began manufacturing Mylar® foil calibration standards for magnetic induction and Eddy current coating thickness measurement instruments. These standards are now the finest available, used in a variety of high-end research applications and private-labeled for certain instrument manufacturers.
Alternate Systems calibrates and services a variety of test and measuring instruments and process controls with specialization in pharmaceutical cold chain temperature calibration and FDA validation protocols including temperature mapping. Alternate Systems employs Fluke calibrators with MET/TEAM and MET CAL software for electronic test and measurement calibration, and Fluke temperature calibrators and reference thermometers for temperature calibration. Rotronic data loggers are deployed for temperature and humidity mapping.
We provide radiation and laser safety training, radiation surveys, and expert consultation in coating measurement and analysis to manufacturers, defense manufacturers, surface finishers and research laboratories.