SFT 9500 Series High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge

Name
High Performance Fluorescent X-ray Coating Thickness Gauge
Type
SFT 9500 Series
Overview
Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1 mm in diameter. Consequently, SFT 9500 Series is capable of measurements of micro spots and thin film applications such as lead frames, connectors, and flexible PCBs that are difficult to measure with conventional models due to insufficient fluorescent X-ray intensity from measurement samples. Also suitable for RoHS & ELV analysis.
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Ultra Thin Film and Multilayered Film Measurement

Poly capillary X-ray focusing optics system enables micro beam size of less than 0.1 mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, SFT 9500 series has a capability of quantitative measurement of single nanometer of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layers in multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.

Mapping

Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.

Hazardous Substance Analysis (for RoHS and ELV compliance)

SFT9 500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector (liquid nitrogen free) is able to detect microelements. Examples are Pb in Pb-free solder and electoless nickel that are typical components in electric, electronics, and automotive products.

Particle Analysis

High intensity micro beam combined with high count rate detector makes possible particle analysis. CCD camera can specify particles, and then subtraction spectrum display functions allow the qualitative analysis of the particles (Al to U).

Data Processing

Microsoft® EXCEL is equipped with statistical processing function that compiles measurement data as STDEV, Mean, Max, Min, CV, and Cpk. Microsoft® WORD provides detailed measurement reports with the sample image

Type
SFT 9500 SFT 9550
Elements
Atomic No. 13 (Al) to 83 (Bi)
X-ray source
Air-cooled X-ray Tube (Mo target)
Voltage: 50 kV
Current: 1 mA
Detector
Semiconductor Detector (No LN2 required)
X-Ray Focusing Optics System
Capillary
Sample Observation
CCD camera with zoom
Sample image focus
Laser Pointer
Filter
Primary filter: 3 positions automatic switching
Secondary filter: Co, automatic switching
Sample Stage
  (Stage size )
  (Traveling )

640 (W) x 810 (D) x 900 (H) mm
X: 220 mm, Y: 150 mm, Z: 150 mm 930 (W) x 860 (D) x 900 (H) mm
X: 400 mm, Y: 300 mm, Z: 50 mm
Controller
Desktop Computer with 19 inch LCD monitor
Application Software
Thin Film FP (All types of thin films: Max 5 layers, 10 elements per layer), Calibration, Bulk FP method (material composition analysis)
Data Processing
Microsoft® Excel, Microsoft® Word
Safety Function
Sample door interlock, Sample crash prevention mechanism
Options
• Coating solution analysis (Bulk Calibration)
• Spectrum matching software (Material ID)
• Mapping (Intensity surface analysis multi point display) software
• Filter for ultrathin Au film
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