SFT-110 Fluorescent X-ray (XRF)
Coating Thickness Gauge
Name
Fluorescent X-ray Coating Thickness Gauge
Type
SFT-110
Overview
New auto focus function allows the sample image to be focused within few seconds automatically.
Manual adjustment is not required resulting in dramatically improved throughput.
Easy setting
Optical image of the sample automatically appears on the display once the sample is placed on the stage.
50nm Au plating thickness can be measured precisely in 10 seconds
Optimum measuring head geometry produces higher sensitivity even with micro beam, enabling better measurement accuracy with round 0.1 mm or 0.2 mm collimator.
Measurement without the standard sample.
Measurement can be done without thickness standard sample(s) with the FP (fundamental parameters) software. Measurement of multilayer plating and alloy plating can be done easily.
Easy positioning by Wide View System
New Wide View System (option) enables observation of the whole sample image (size max. 250 mm x 200 mm), making selection of the measurement position fast and easy.
Elements
Atomic Numbers 22 (Ti) to 83 (Bi)
X-ray source
Air-cooled small X-Ray Tube
Voltage : 50 kV
Current: 1 mA
Voltage : 50 kV
Current: 1 mA
Detector
Proportional Counter
Collimator
Round. 0.1 mm, 0.2 mm and two other types
Sample Observation
CCD camera (with wide view system)
Sample image focus
Laser Pointer
Filter
Primary filter automatic switching
Sample Stage
(Stage size )
(Traveling )
(Stage size )
(Traveling )
500 (W) x 400 (D) x 150 (H)mm
X:250 mm, Y:200 mm
Controller
Desktop Computer with 19 inch LCD Monitor
Application Software
Thin Film FP (All types of thin films: Max 5 layers, 10 elements per layer), Calibration
Data Process
Microsoft® Excel, Microsoft® Word
Safety Function
Sample door interlock, Sample crash prevention mechanism, Diagnostic function
Options
• Mapping software
• Bulk FP method (Material component analysis)
• Bulk Calibration method (Coating solution analysis)
• Bulk FP method (Material component analysis)
• Bulk Calibration method (Coating solution analysis)
*Microsoft is a registered trademark of Microsoft Corporation in the United States and other countries.
Calibration
Coating Thickness
Standards
Standards
Cold Chain
Management
Management
X-Ray
Analysis & Safety
Analysis & Safety
XRF Machines
& Standards
& Standards