SEA6000VX HSFinder

High Speed Mapping

High count rate detector of 150,000 cps at maximum and large stage that scans 250mm x 200mm area at maximum enables high speed mapping. In 100mm x 100mm area mapping, SEA6000VX detects and locates lead contained in terminal of mounting board in a few minutes.

LN2 Less High Count Rate Detector

Equipped with the world's best class high count rate detector (15 times improved count rate compared with conventional model), SEA6000VX improves measurement efficiency.

Additionally, the detector does not require LN2, improving safety and work efficiency of an operator.

Continuous multi-point measurements

Up to 500 points can be set and continuously measured as with an auto-sampler. Measuring large samples exhibits tremendous throughput.

High Precision Overlap Function

By high precision analysis over a wide area enabled by the complete overlap of sample image and mapping image by employing a telecentric optic system and high precision XY stage, areas that contain target elements are easily specified. Whole area of 250mm x 200mm is shown in top view, and position precision of zoom in from wide view is within 100um.

Microscopic area coating thickness measurements

The SEA6000VX is capable of coating thickness measurements typical of the SFT series including coating thickness measurement of ultra-thin Au films. Analysis of hazardous substances such as Pb in plating can be measured simultaneously with coating thickness measurements.

For example, possibilities include composition measurement of hazardous substances in Pb-free solder plating, Sn plating of lead frames, and electroless Ni plating.

RoHS Inspection

Enables effective and highly sensitive analysis of RoHS restricted substances contained in resin and metals. Specific point measurement for complex material is possible.

Light Element Measurement

With He purge option, SEA6000VX is able to measure light elements starting from Na. Its stable and unique system that purges He only during measurement lowers the running cost.

See-through Mapping Fuction

Beginning with Pb on internal boards, various mapping images of elements can be obtained without taking apart products with unknown internal structures, such as laptop computers and cell phones. By comparing mapping images of elements obtained by penetrating X-rays, various information can be obtained about the structure and internal components.

Contaminant Analysis

With \its high speed mapping function, SEA6000VX is able to detect and locate small metal contaminant sized around tens of micro meters in wide measurement area (at maximum of 250mm x 200mm). Small or minute amount of contaminant contained in organic substances including resin, can be also detected.

Technologically Enhanced Operability -Auto Approach and Sample Collision Prevention Mechanism-

Auto Approach Function measures the sample height and automatically adjusts the distance between sample and detector so that operator can easily measure samples with complicated shapes. In the case of manual operation, Sample Collision Prevention Mechanism prevents sample damages.