SEA2200A series Hazardous Substance Monitor

XRF Analyzer suitable for RoHS & ELV analysis

Name
Hazardous Substance Monitor
Type
SEA2200A series
Overview
SEA2200A series is equipped with a compensation software that minimizes effects of the measurement sample's shape, thickness and composition. It can quickly and easily make measurements of such hazardous substances as cadmium and lead in plastic without preparing samples. It is useful for inspecting large volumes of goods for compliance with RoHS and ELV.
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Compliant with Analysis for RoHS

Successor to the SEA2100 series, and able to measure extremely small amount of Cd, Pb, Hg, Br and Cr restricted by RoHS directive.

High Sensitivity

Newly developed first filter enables detection of Cd and Pb levels of several ppm in plastic samples. (Limited to samples not containing coexisting elements such as Br.)

Correction for Sample Shape and Thickness

Correcting function has made the measurement free from preparing samples to equalize their form, thickness and dimension.

Correction for PVC

One measurement condition can be used for various plastics.

Collimators suited for measurement condition

Equipped with 2 type collimators: round 10mm and 3mm.

Large Chamber

Equipped with large sample chamber. (300mm x 170mm x 75mm)

CCD Camera Equipped

A CCD camera lets you view specific point while measuring the sample.

Hazardous Substance Data Management

Equipped with Hazardous Substance Data Management function that enables comparison between measurement result and detailed data of the sample.

Measurement of Ultra-light Element (C, N, O, F)

Employs an HTW (high transmission window) detector that allows high transmission of lower energies compared to the Be window and measurement of ultra-light elements achieves that were not possible before. (SEA2220A)

Elements
Atomic nos. 11 (Na) to 92 (U)
Atomic nos. 6 (C) to 92 (U) (HTW: type 2220A)
Sample State
Solid / Powder / Liquid
X-ray source
Air-cooled X-ray Tube (Rh target)
Voltage: 5kV, 15kV, 50kV (3 step switching)
Current: Maximum 1mA
X-ray direction
Bottom-up Irradiation
Detector
Si semiconductor detector
LN2 Dewar Capacity: 10L
Analysis area (beam size)
10mm, 3mm
Sample Observation
Color CCD camera
Chamber
Maximum sample size: 300 (W) x 170 (D) X 80(H) mm
Filter
Primary: 3 filters automatic switching
Controller
Desktop computer with LCD monitor
Qualitative functions
Auto-ID, Comparison display
Quantitative functions
Bulk (FP) CAL, Calibration
Data Process
Microsoft® Excel, Microsoft® Word
Power requirements (Electric box included)
AC100V ±10%, 5A
• HSEASY (Precision control software)
• Spectrum Matching Software (Material Discrimination)
• Film Analysis FP Software
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